Fingerprint Dive into the research topics where Metrología y calidad is active. These topic labels come from the works of this organization's members. Together they form a unique fingerprint.

  • Network Recent external collaboration on country level. Dive into details by clicking on the dots.

    Research Output

    • 1 Citations
    • 1 h-Index
    • 1 Article
    • 1 Patent


    Pacheco Ramírez, J. H., Benitez, V. H., Herrera Jimenez, V. M. & Ramirez Ponce de León, H. M., 23 May 2019, Patent No. MX/a/2012/009939, 17 Aug 2012

    Research output: Patent

  • Mathematical calibration procedure of a capacitive sensor-based indexed metrology platform

    Brau Ávila, A., Valenzuela Galván, M., Herrera Jimenez, V. M., Santolaria Mazo, J., Acero Cacho, R. & Aguilar Martín, J. J., 2017, In : Measurement Science and Technology. 28, 3, 13 p., 3.

    Research output: Contribution to journalArticle