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Fingerprint Fingerprint is based on mining the text of the person's scientific documents to create an index of weighted terms, which defines the key subjects of each individual researcher.

  • 2 Similar Profiles
Nanotechnology Engineering & Materials Science
Calibration Engineering & Materials Science
Sensors Engineering & Materials Science
coders Physics & Astronomy
Precision engineering Engineering & Materials Science
Budget control Engineering & Materials Science
grids Physics & Astronomy
Surface topography Engineering & Materials Science

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Publicaciones 2009 2017

  • 45 Citations
  • 3 h-Index
  • 11 Paper
  • 4 Article
  • 1 Conference contribution
  • 1 Scientific review

Geometrical characterisation of a 2D laser system and calibration of a cross-grid encoder by means of a self-calibration methodology

Torralba, M., Díaz-Pérez, L. C., Valenzuela, M., Albajez, J. A. & Yagüe-Fabra, J. A., 1 Sep 2017, In : Sensors (Switzerland).

Research output: Contribution to journalArticleResearchpeer-review

coders
Calibration
Lasers
grids
methodology

Mathematical calibration procedure of a capacitive sensor-based indexed metrology platform

Brau Ávila, A., Valenzuela Galván, M., Herrera Jimenez, V. M., Santolaria Mazo, J., Acero Cacho, R. & Aguilar Martín, J. J., 2017, In : Measurement Science and Technology. 28, 3, 13 p., 3.

Research output: Contribution to journalArticleResearchpeer-review

A self-calibration methodology for a 2D-long range motion stage

Torralba, M., Díaz-Pérez, L., Valenzuela, M., Albajez, J., Yagüe-Fabra, J. & Aguilar, J., 1 Jan 2016.

Research output: Contribution to conferencePaperResearch

artifacts
methodology
coders
readout
proposals
12 Citations (Scopus)

Large range nanopositioning stage design: A three-layer and two-stage platform

Torralba, M., Valenzuela, M., Yagüe-Fabra, J. A., Albajez, J. A. & Aguilar, J. J., 1 Jul 2016, In : Measurement: Journal of the International Measurement Confederation. p. 55-71 17 p.

Research output: Contribution to journalScientific reviewResearchpeer-review

platforms
nanotechnology
Nanotechnology
Precision engineering
Measurement errors

A three-layer and two-stage platform for positioning with nanometer resolution and submicrometer accuracy

Torralba, M., Yagüe-Fabra, J. A., Albajez, J. A., Valenzuela, M., Acero, R. & Aguilar, J. J., 1 Jan 2014, p. 132-135. 4 p.

Research output: Contribution to conferencePaperResearch

Precision engineering
Surface topography
Nanotechnology
Atomic force microscopy
Finite element method

Projects 2014 2017

Activities 2015 2017

  • 2 Examination
  • 1 Editorial work