Research Output per year
Fingerprint Fingerprint is based on mining the text of the person's scientific documents to create an index of weighted terms, which defines the key subjects of each individual researcher.
- 4 Similar Profiles
Nanotechnology
Engineering & Materials Science
Calibration
Engineering & Materials Science
Sensors
Engineering & Materials Science
coders
Physics & Astronomy
Precision engineering
Engineering & Materials Science
Budget control
Engineering & Materials Science
grids
Physics & Astronomy
Surface topography
Engineering & Materials Science
Network
Recent external collaboration on country level. Dive into details by clicking on the dots.
Research Output 2009 2017
Geometrical characterisation of a 2D laser system and calibration of a cross-grid encoder by means of a self-calibration methodology
Torralba, M., Díaz-Pérez, L. C., Valenzuela, M., Albajez, J. A. & Yagüe-Fabra, J. A., 1 Sep 2017, In : Sensors (Switzerland).Research output: Contribution to journal › Article › Research › peer-review
coders
Calibration
Lasers
grids
methodology
Mathematical calibration procedure of a capacitive sensor-based indexed metrology platform
Brau Ávila, A., Valenzuela Galván, M., Herrera Jimenez, V. M., Santolaria Mazo, J., Acero Cacho, R. & Aguilar Martín, J. J., 2017, In : Measurement Science and Technology. 28, 3, 13 p., 3.Research output: Contribution to journal › Article › Research › peer-review
A self-calibration methodology for a 2D-long range motion stage
Torralba, M., Díaz-Pérez, L., Valenzuela, M., Albajez, J., Yagüe-Fabra, J. & Aguilar, J., 1 Jan 2016.Research output: Contribution to conference › Paper › Research
artifacts
methodology
coders
readout
proposals
Large range nanopositioning stage design: A three-layer and two-stage platform
Torralba, M., Valenzuela, M., Yagüe-Fabra, J. A., Albajez, J. A. & Aguilar, J. J., 1 Jul 2016, In : Measurement: Journal of the International Measurement Confederation. p. 55-71 17 p.Research output: Contribution to journal › Scientific review › Research › peer-review
platforms
nanotechnology
Nanotechnology
Precision engineering
Measurement errors
A three-layer and two-stage platform for positioning with nanometer resolution and submicrometer accuracy
Torralba, M., Yagüe-Fabra, J. A., Albajez, J. A., Valenzuela, M., Acero, R. & Aguilar, J. J., 1 Jan 2014, p. 132-135. 4 p.Research output: Contribution to conference › Paper › Research
Precision engineering
Surface topography
Nanotechnology
Atomic force microscopy
Finite element method
Projects 2014 2017
- 2 Finished
Verificación volumétrica de un brazo articulado de medir por coordenadas utilizado en la industria automotriz
1/09/16 → 1/09/17
Project: Research
Diseño de una plataforma de posicionamiento para un sistema de microespectroscopía Raman de alta resolución
1/08/14 → 1/08/15
Project: Research
Activities 2015 2017
”, 4o Congresso Internacional de Desenvolvimento da Engenharia Industrial (Event)
Margarita Valenzuela Galván (Reviewer)1 Jun 2017 → …
Activity: Editorial work types › Editorial work
Verificación volumétrica de un brazo articulado de medición por coordenadas utilizado en la industria automotriz
Margarita Valenzuela Galván (Examiner)29 Sep 2017 → …
Activity: Examination types › Examination
Diseño de una plataforma de posicionamiento XY para un sistema de microscopía
Margarita Valenzuela Galván (Examiner)26 Jun 2015 → …
Activity: Examination types › Examination