Original language | American English |
---|---|
Pages (from-to) | 1803-1809 |
Number of pages | 7 |
Journal | IEEE Transactions on Electron Devices |
DOIs | |
State | Published - 1 May 2018 |
Externally published | Yes |
A compact drain current model for thin-film transistor under bias stress condition
Rodolfo Garcia, Israel Mejia, Julio Tinoco, Jesus Ezequiel Molinar-Solis, Alejandra Morales, Miguel Aleman, Sergio Sandoval, Manuel A. Quevedo-Lopez
Research output: Contribution to journal › Article › peer-review
3
Scopus
citations