A compact drain current model for thin-film transistor under bias stress condition

Rodolfo Garcia, Israel Mejia, Julio Tinoco, Jesus Ezequiel Molinar-Solis, Alejandra Morales, Miguel Aleman, Sergio Sandoval, Manuel A. Quevedo-Lopez

Research output: Contribution to journal › Article › Research › peer-review

1 Citation (Scopus)
Original languageAmerican English
Pages (from-to)1803-1809
Number of pages7
JournalIEEE Transactions on Electron Devices
DOIs
StatePublished - 1 May 2018
Externally publishedYes

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Drain current
Thin film transistors
Semiconductor materials
Degradation
Networks (circuits)

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Garcia, R., Mejia, I., Tinoco, J., Molinar-Solis, J. E., Morales, A., Aleman, M., ... Quevedo-Lopez, M. A. (2018). A compact drain current model for thin-film transistor under bias stress condition. IEEE Transactions on Electron Devices, 1803-1809. https://doi.org/10.1109/TED.2018.2818694
Garcia, Rodolfo ; Mejia, Israel ; Tinoco, Julio ; Molinar-Solis, Jesus Ezequiel ; Morales, Alejandra ; Aleman, Miguel ; Sandoval, Sergio ; Quevedo-Lopez, Manuel A. / A compact drain current model for thin-film transistor under bias stress condition. In: IEEE Transactions on Electron Devices. 2018 ; pp. 1803-1809.
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Garcia, R, Mejia, I, Tinoco, J, Molinar-Solis, JE, Morales, A, Aleman, M, Sandoval, S & Quevedo-Lopez, MA 2018, 'A compact drain current model for thin-film transistor under bias stress condition', IEEE Transactions on Electron Devices, pp. 1803-1809. https://doi.org/10.1109/TED.2018.2818694

A compact drain current model for thin-film transistor under bias stress condition. / Garcia, Rodolfo; Mejia, Israel; Tinoco, Julio; Molinar-Solis, Jesus Ezequiel; Morales, Alejandra; Aleman, Miguel; Sandoval, Sergio; Quevedo-Lopez, Manuel A.

In: IEEE Transactions on Electron Devices, 01.05.2018, p. 1803-1809.

Research output: Contribution to journal › Article › Research › peer-review

TY - JOUR

T1 - A compact drain current model for thin-film transistor under bias stress condition

AU - Garcia, Rodolfo

AU - Mejia, Israel

AU - Tinoco, Julio

AU - Molinar-Solis, Jesus Ezequiel

AU - Morales, Alejandra

AU - Aleman, Miguel

AU - Sandoval, Sergio

AU - Quevedo-Lopez, Manuel A.

PY - 2018/5/1

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DO - 10.1109/TED.2018.2818694

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JO - IEEE Transactions on Electron Devices

JF - IEEE Transactions on Electron Devices

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Garcia R, Mejia I, Tinoco J, Molinar-Solis JE, Morales A, Aleman M et al. A compact drain current model for thin-film transistor under bias stress condition. IEEE Transactions on Electron Devices. 2018 May 1;1803-1809. https://doi.org/10.1109/TED.2018.2818694

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