A compact drain current model for thin-film transistor under bias stress condition

Rodolfo Garcia, Israel Mejia, Julio Tinoco, Jesus Ezequiel Molinar-Solis, Alejandra Morales, Miguel Aleman, Sergio Sandoval, Manuel A. Quevedo-Lopez

Research output: Contribution to journalArticle

2 Scopus citations
Original languageAmerican English
Pages (from-to)1803-1809
Number of pages7
JournalIEEE Transactions on Electron Devices
DOIs
StatePublished - 1 May 2018
Externally publishedYes

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