A compact drain current model for thin-film transistor under bias stress condition

Rodolfo Garcia; Israel Mejia; Julio Tinoco; Jesus Ezequiel Molinar-Solis; Alejandra Morales; Miguel Aleman; Sergio Sandoval; Manuel A. Quevedo-Lopez

doi:10.1109/TED.2018.2818694

A compact drain current model for thin-film transistor under bias stress condition

Rodolfo Garcia, Israel Mejia, Julio Tinoco, Jesus Ezequiel Molinar-Solis, Alejandra Morales, Miguel Aleman, Sergio Sandoval, Manuel A. Quevedo-Lopez

Research output: Contribution to journal › Article › peer-review

3 Scopus citations

Original language	American English
Pages (from-to)	1803-1809
Number of pages	7
Journal	IEEE Transactions on Electron Devices
DOIs	https://doi.org/10.1109/TED.2018.2818694
State	Published - 1 May 2018
Externally published	Yes

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10.1109/TED.2018.2818694

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@article{6ab0dad2cb3d45b997954f480e793d63,

title = "A compact drain current model for thin-film transistor under bias stress condition",

author = "Rodolfo Garcia and Israel Mejia and Julio Tinoco and Molinar-Solis, {Jesus Ezequiel} and Alejandra Morales and Miguel Aleman and Sergio Sandoval and Quevedo-Lopez, {Manuel A.}",

year = "2018",

month = may,

day = "1",

doi = "10.1109/TED.2018.2818694",

language = "American English",

pages = "1803--1809",

journal = "IEEE Transactions on Electron Devices",

issn = "0018-9383",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

}

A compact drain current model for thin-film transistor under bias stress condition. / Garcia, Rodolfo; Mejia, Israel; Tinoco, Julio; Molinar-Solis, Jesus Ezequiel; Morales, Alejandra; Aleman, Miguel; Sandoval, Sergio; Quevedo-Lopez, Manuel A.

In: IEEE Transactions on Electron Devices, 01.05.2018, p. 1803-1809.

Research output: Contribution to journal › Article › peer-review

TY - JOUR

T1 - A compact drain current model for thin-film transistor under bias stress condition

AU - Garcia, Rodolfo

AU - Mejia, Israel

AU - Tinoco, Julio

AU - Molinar-Solis, Jesus Ezequiel

AU - Morales, Alejandra

AU - Aleman, Miguel

AU - Sandoval, Sergio

AU - Quevedo-Lopez, Manuel A.

PY - 2018/5/1

Y1 - 2018/5/1

U2 - 10.1109/TED.2018.2818694

DO - 10.1109/TED.2018.2818694

M3 - Article

SP - 1803

EP - 1809

JO - IEEE Transactions on Electron Devices

JF - IEEE Transactions on Electron Devices

SN - 0018-9383

ER -