TY - JOUR
T1 - A polylogarithmic model for thin-film transistors used in a CMOS inverter amplifier
AU - Ortiz-Conde, Adelmo
AU - Ávila-Avendaño, Carlos
AU - Caraveo-Frescas, Jesús A.
AU - Quevedo-López, Manuel A.
AU - García-Sánchez, Francisco J.
N1 - Publisher Copyright:
© 2021 Elsevier Ltd
PY - 2022/2
Y1 - 2022/2
N2 - This article presents a generalization of a transregional polylogarithmic model, previously proposed for continuously describing the transfer characteristics of polycrystalline and amorphous Thin Film Transistors (TFTs) at all levels of inversion. The present generalization entails including the necessary drain voltage dependencies to be able to describe also the output characteristics. The model is tested by using it in the design and analysis of a CMOS inverter amplifier consisting of poly-Si n- and p-channel TFTs fabricated at low temperature and pressure. The transistors are biased below threshold so that the CMOS amplifier circuit operates in weak conduction, having in mind energy saving considerations. The validity of the proposed model has been ascertained by comparing model simulations to actual measured data from individual poly-Si TFTs and from the CMOS amplifier circuit. The simulations of the CMOS inverter amplifier are compared to the results obtained using look-up table-type simulations.
AB - This article presents a generalization of a transregional polylogarithmic model, previously proposed for continuously describing the transfer characteristics of polycrystalline and amorphous Thin Film Transistors (TFTs) at all levels of inversion. The present generalization entails including the necessary drain voltage dependencies to be able to describe also the output characteristics. The model is tested by using it in the design and analysis of a CMOS inverter amplifier consisting of poly-Si n- and p-channel TFTs fabricated at low temperature and pressure. The transistors are biased below threshold so that the CMOS amplifier circuit operates in weak conduction, having in mind energy saving considerations. The validity of the proposed model has been ascertained by comparing model simulations to actual measured data from individual poly-Si TFTs and from the CMOS amplifier circuit. The simulations of the CMOS inverter amplifier are compared to the results obtained using look-up table-type simulations.
KW - CMOS inverter amplifier
KW - Lookup Table
KW - MOSFET
KW - Parameter extraction
KW - Weak-inversion
KW - polysilicon thin-film transistors (TFTs)
UR - http://www.scopus.com/inward/record.url?scp=85121435668&partnerID=8YFLogxK
U2 - 10.1016/j.sse.2021.108218
DO - 10.1016/j.sse.2021.108218
M3 - Artículo
AN - SCOPUS:85121435668
SN - 0038-1101
VL - 188
JO - Solid-State Electronics
JF - Solid-State Electronics
M1 - 108218
ER -