Automation of an I-V characterization system

Research output: Contribution to journalArticleResearchpeer-review

1 Citation (Scopus)
Original languageAmerican English
Pages (from-to)200-210
Number of pages11
JournalJournal of Applied Research and Technology
StatePublished - 1 Aug 2010

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Automation
Electronic equipment
Electrometers
Semiconductor devices
Teaching
Semiconductor materials
Network protocols
Testing
Processing
Experiments

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@article{1855f68b677543fa80973f151303ff38,
title = "Automation of an I-V characterization system",
author = "Noriega, {J. R.} and A. Vera-Marquina and {Acosta Enr{\'i}quez}, C.",
year = "2010",
month = "8",
day = "1",
language = "American English",
pages = "200--210",
journal = "Journal of Applied Research and Technology",
issn = "1665-6423",
publisher = "Centro de Ciencias Aplicadas y Desarrollo Tecnologico, Universidad Nacional Autonoma de Mexico",

}

Automation of an I-V characterization system. / Noriega, J. R.; Vera-Marquina, A.; Acosta Enríquez, C.

In: Journal of Applied Research and Technology, 01.08.2010, p. 200-210.

Research output: Contribution to journalArticleResearchpeer-review

TY - JOUR

T1 - Automation of an I-V characterization system

AU - Noriega, J. R.

AU - Vera-Marquina, A.

AU - Acosta Enríquez, C.

PY - 2010/8/1

Y1 - 2010/8/1

M3 - Article

SP - 200

EP - 210

JO - Journal of Applied Research and Technology

JF - Journal of Applied Research and Technology

SN - 1665-6423

ER -