Capacitive sensors based kinematic modeling of an indexed metrology platform

A. Brau; J. Santolaria; J. J. Aguilar; M. Pueo

Capacitive sensors based kinematic modeling of an indexed metrology platform

A. Brau, J. Santolaria, J. J. Aguilar, M. Pueo

Research output: Contribution to conference › Paper

Original language	American English
Pages	206-209
Number of pages	4
State	Published - 1 Jan 2012
Externally published	Yes
Event	Proceedings of the 12th International Conference of the European Society for Precision Engineering and Nanotechnology, EUSPEN 2012 - Duration: 1 Jan 2012 → …

Conference

Conference	Proceedings of the 12th International Conference of the European Society for Precision Engineering and Nanotechnology, EUSPEN 2012
Period	1/01/12 → …

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Brau, A., Santolaria, J., Aguilar, J. J., & Pueo, M. (2012). Capacitive sensors based kinematic modeling of an indexed metrology platform. 206-209. Paper presented at Proceedings of the 12th International Conference of the European Society for Precision Engineering and Nanotechnology, EUSPEN 2012, . https://www.scopus.com/inward/record.uri?partnerID=HzOxMe3b&scp=84911366417&origin=inward

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title = "Capacitive sensors based kinematic modeling of an indexed metrology platform",

author = "A. Brau and J. Santolaria and Aguilar, {J. J.} and M. Pueo",

year = "2012",

month = jan,

day = "1",

language = "American English",

pages = "206--209",

note = "Proceedings of the 12th International Conference of the European Society for Precision Engineering and Nanotechnology, EUSPEN 2012 ; Conference date: 01-01-2012",

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Brau, A, Santolaria, J, Aguilar, JJ & Pueo, M 2012, 'Capacitive sensors based kinematic modeling of an indexed metrology platform', Paper presented at Proceedings of the 12th International Conference of the European Society for Precision Engineering and Nanotechnology, EUSPEN 2012, 1/01/12 pp. 206-209. <https://www.scopus.com/inward/record.uri?partnerID=HzOxMe3b&scp=84911366417&origin=inward>

TY - CONF

T1 - Capacitive sensors based kinematic modeling of an indexed metrology platform

AU - Brau, A.

AU - Santolaria, J.

AU - Aguilar, J. J.

AU - Pueo, M.

PY - 2012/1/1

Y1 - 2012/1/1

M3 - Paper

SP - 206

EP - 209

T2 - Proceedings of the 12th International Conference of the European Society for Precision Engineering and Nanotechnology, EUSPEN 2012

Y2 - 1 January 2012

ER -