Characterization of organic thin films using transmission electron microscopy and Fourier Transform Infra Red spectroscopy

Unnat S. Bhansali; M. A. Quevedo Lopez; Huiping Jia; H. N. Alshareef; DongKyu Cha; M. J. Kim; Bruce E. Gnade

doi:10.1016/j.tsf.2009.03.002

Characterization of organic thin films using transmission electron microscopy and Fourier Transform Infra Red spectroscopy

Unnat S. Bhansali, M. A. Quevedo Lopez, Huiping Jia, H. N. Alshareef, DongKyu Cha, M. J. Kim, Bruce E. Gnade

Research output: Contribution to journal › Article › peer-review

Original language	American English
Pages (from-to)	5825-5829
Number of pages	5
Journal	Thin Solid Films
DOIs	https://doi.org/10.1016/j.tsf.2009.03.002
State	Published - 31 Aug 2009
Externally published	Yes

Access to Document

10.1016/j.tsf.2009.03.002

https://www.scopus.com/inward/record.uri?partnerID=HzOxMe3b&scp=66949172040&origin=inward

Fingerprint Dive into the research topics of 'Characterization of organic thin films using transmission electron microscopy and Fourier Transform Infra Red spectroscopy'. Together they form a unique fingerprint.

Cite this

@article{848a0432bc5045fcad4761a15c285f6f,

title = "Characterization of organic thin films using transmission electron microscopy and Fourier Transform Infra Red spectroscopy",

author = "Bhansali, {Unnat S.} and {Quevedo Lopez}, {M. A.} and Huiping Jia and Alshareef, {H. N.} and DongKyu Cha and Kim, {M. J.} and Gnade, {Bruce E.}",

year = "2009",

month = aug,

day = "31",

doi = "10.1016/j.tsf.2009.03.002",

language = "American English",

pages = "5825--5829",

journal = "Thin Solid Films",

issn = "0040-6090",

publisher = "Elsevier",

}

TY - JOUR

T1 - Characterization of organic thin films using transmission electron microscopy and Fourier Transform Infra Red spectroscopy

AU - Bhansali, Unnat S.

AU - Quevedo Lopez, M. A.

AU - Jia, Huiping

AU - Alshareef, H. N.

AU - Cha, DongKyu

AU - Kim, M. J.

AU - Gnade, Bruce E.

PY - 2009/8/31

Y1 - 2009/8/31

U2 - 10.1016/j.tsf.2009.03.002

DO - 10.1016/j.tsf.2009.03.002

M3 - Article

SP - 5825

EP - 5829

JO - Thin Solid Films

JF - Thin Solid Films

SN - 0040-6090

ER -