Original language | American English |
---|---|
Pages (from-to) | 5825-5829 |
Number of pages | 5 |
Journal | Thin Solid Films |
DOIs | |
State | Published - 31 Aug 2009 |
Externally published | Yes |
Characterization of organic thin films using transmission electron microscopy and Fourier Transform Infra Red spectroscopy
Unnat S. Bhansali, M. A. Quevedo Lopez, Huiping Jia, H. N. Alshareef, DongKyu Cha, M. J. Kim, Bruce E. Gnade
Research output: Contribution to journal › Article › peer-review
5
Scopus
citations