In this work a characterization system for high energy-density capacitors is described and demonstrated. Capacitors are being designed using thin-film technology in an attempt to achieve higher energy-density levels by operating the devices at a high voltage. These devices are fabricated from layers of 100 nm aluminum and a layer of polyvinylidene fluoride-hexafluoropropylene on a polyethylene naphthalate plastic substrate. The devices have been designed to store electrical charge at up to 200 V. Characterizations of these devices focus on the measurement of capacitance vs bias voltage and temperature, equivalent series resistance, and charge/discharge cycles. For the purpose of the characterization of these capacitors, an electronic charge/discharge interface was designed and tested.
Bibliographical noteFunding Information:
The work described was funded by a U.S. Department of Energy grant (DE-EE0004186, CFDA 81.087), and also partially funded by the Texas Allergy, Indoor Environment and Energy Institute (TxAIRE) at the University of Texas (UT) at Tyler in collaboration with the University of Texas at Dallas, Group of Flexible Electronics Research. We would also like to thank Dr. Hector Ochoa of the Electrical Engineering Department at UT Tyler for his assistance in in-house fabrication of PCBs for the charge discharge interface.