Comparative study of PbS thin films growth by two different formulations using chemical bath deposition

H. A. Pineda-Leon, G. Gutierrez-Heredia, A. De Leon*, R. Ochoa-Landin, R. Ramirez-Bon, M. Flores-Acosta, S. J. Castillo

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

2 Scopus citations


PbS thin films were obtained using the chemical bath deposition (CBD) technique at 60° C. In this paper were compared two formulations: the standard and a new one. The main result of this work is to report the new chemical formulation to build the PbS thin films, where polyethyleneimine has been used as a complexing agent. With a reaction time of 7.5 minutes we obtain a thickness of 120 nm measured with a profilometer. The structural studies, using X-ray diffraction, show that the thin film is polycrystalline and strongly oriented on the (1,1,1) plane of a cubic structure, while the thin film for the traditional formulation has a preference orientation on the (2,0,0) plane. Morphology by atomic force microscopy depicts a better flatness for the new formulation than with the traditional one. Scanning electron microscopy shows clearly in images the consistency with X-ray diffraction. Also, the optical absorption and transmission for both materials are described as a comparative in the UV-vis region. Finally to reinforce this characterization of the material, to a basic science level, XPS spectra were obtained where we can be observe only those chemical element peaks expected.

Original languageEnglish
Article number3
Pages (from-to)161-168
Number of pages8
JournalChalcogenide Letters
Issue number4
StatePublished - Apr 2016

Bibliographical note

Publisher Copyright:
© 2016, National Institute R and D of Materials Physics. All rights reserved.


  • Lead sulfide
  • Polyethyleneimine
  • Semiconductors
  • Thin film


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