Abstract
PbS thin films were obtained using the chemical bath deposition (CBD) technique at 60° C. In this paper were compared two formulations: the standard and a new one. The main result of this work is to report the new chemical formulation to build the PbS thin films, where polyethyleneimine has been used as a complexing agent. With a reaction time of 7.5 minutes we obtain a thickness of 120 nm measured with a profilometer. The structural studies, using X-ray diffraction, show that the thin film is polycrystalline and strongly oriented on the (1,1,1) plane of a cubic structure, while the thin film for the traditional formulation has a preference orientation on the (2,0,0) plane. Morphology by atomic force microscopy depicts a better flatness for the new formulation than with the traditional one. Scanning electron microscopy shows clearly in images the consistency with X-ray diffraction. Also, the optical absorption and transmission for both materials are described as a comparative in the UV-vis region. Finally to reinforce this characterization of the material, to a basic science level, XPS spectra were obtained where we can be observe only those chemical element peaks expected.
Original language | English |
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Article number | 3 |
Pages (from-to) | 161-168 |
Number of pages | 8 |
Journal | Chalcogenide Letters |
Volume | 13 |
Issue number | 4 |
State | Published - Apr 2016 |
Bibliographical note
Publisher Copyright:© 2016, National Institute R and D of Materials Physics. All rights reserved.
Keywords
- Lead sulfide
- Polyethyleneimine
- Semiconductors
- Thin film