Comparison of the Real Part of Dielectric Constants with Different Materials to Decrease the Emittance and a Virtual Dielectric Constant to Reproduce Reflectance

Jesús Manuel Gutiérrez-Villarreal, Horacio Antolin Pineda-León, Mario F. Suzuki Valenzuela, Ian Sosa-Tinoco*, Santos Jesús Castillo

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

Abstract

This paper analyzes how the real part of the dielectric constant affects the emittance or temperature in some materials. A two-layer configuration was implemented on a glass substrate, with theory and experiment, on a sunny day in Mexico. Furthermore, the transfer matrix method was used as theory, changing the material on the top of the substrate and below a film of zinc sulfide. As a result, for a larger real part of the dielectric constant, the emittance decreased in analytical results, and therefore a decrease in temperature was obtained in the experiment. Furthermore, a virtual dielectric constant was obtained from the experimental reflectance in a bilayer system reproducing this system analytically with one layer having different thickness. The finite-difference time-domain (FDTD) method was used to obtain the optimal length of equilateral pyramids on the surface of a flat film by changing the materials to improve the reflectance or decrease the emittance. It was concluded that for a wavelength of the incident source, optimal dimensions of the triangles on the surface exist.

Original languageEnglish
Article number994
JournalPhotonics
Volume10
Issue number9
DOIs
StatePublished - Sep 2023

Bibliographical note

Publisher Copyright:
© 2023 by the authors.

Keywords

  • FDTD
  • passive cooling
  • reflectance

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