Degradation of pentacene deposited on gold, aluminum and parylene surfaces: Impact of pentacene thickness

V. H. Martinez-Landeros, G. Gutierrez-Heredia, F. S. Aguirre-Tostado, M. Sotelo-Lerma, B. E. Gnade, M. A. Quevedo-Lopez*

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

1 Scopus citations

Abstract

In this work, the impact of film thickness in thermally evaporated pentacene thin films and metal electrodes is studied. In particular, we report electrical performance and stability of un-encapsulated organic Schottky diodes. The chemical composition, surface morphology and ambient stability of the resulting films were also studied. The electrical measurements were carried out in vertical Schottky diodes and its performance and stability was evaluated as function of shelf life time. Oxygen was detected at the pentacene surface. This oxygen is the main cause of the diode degradation and attributed to diffusion of oxygen into the bulk of the pentacene films. Thicker pentacene films resulted in more stable for Schottky diodes.

Original languageEnglish
Pages (from-to)398-403
Number of pages6
JournalThin Solid Films
Volume531
DOIs
StatePublished - 2013

Bibliographical note

Funding Information:
This work was partially supported from AFOSR project FA9550-10-1-0183 and Conacyt Mexico ( 158281 ).

Keywords

  • Electrical performance
  • Film thickness
  • Pentacene
  • Schottky diodes

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