TY - JOUR
T1 - Degradation of pentacene deposited on gold, aluminum and parylene surfaces
T2 - Impact of pentacene thickness
AU - Martinez-Landeros, V. H.
AU - Gutierrez-Heredia, G.
AU - Aguirre-Tostado, F. S.
AU - Sotelo-Lerma, M.
AU - Gnade, B. E.
AU - Quevedo-Lopez, M. A.
N1 - Funding Information:
This work was partially supported from AFOSR project FA9550-10-1-0183 and Conacyt Mexico ( 158281 ).
PY - 2013
Y1 - 2013
N2 - In this work, the impact of film thickness in thermally evaporated pentacene thin films and metal electrodes is studied. In particular, we report electrical performance and stability of un-encapsulated organic Schottky diodes. The chemical composition, surface morphology and ambient stability of the resulting films were also studied. The electrical measurements were carried out in vertical Schottky diodes and its performance and stability was evaluated as function of shelf life time. Oxygen was detected at the pentacene surface. This oxygen is the main cause of the diode degradation and attributed to diffusion of oxygen into the bulk of the pentacene films. Thicker pentacene films resulted in more stable for Schottky diodes.
AB - In this work, the impact of film thickness in thermally evaporated pentacene thin films and metal electrodes is studied. In particular, we report electrical performance and stability of un-encapsulated organic Schottky diodes. The chemical composition, surface morphology and ambient stability of the resulting films were also studied. The electrical measurements were carried out in vertical Schottky diodes and its performance and stability was evaluated as function of shelf life time. Oxygen was detected at the pentacene surface. This oxygen is the main cause of the diode degradation and attributed to diffusion of oxygen into the bulk of the pentacene films. Thicker pentacene films resulted in more stable for Schottky diodes.
KW - Electrical performance
KW - Film thickness
KW - Pentacene
KW - Schottky diodes
UR - http://www.scopus.com/inward/record.url?scp=84875454973&partnerID=8YFLogxK
U2 - 10.1016/j.tsf.2012.12.061
DO - 10.1016/j.tsf.2012.12.061
M3 - Artículo
SN - 0040-6090
VL - 531
SP - 398
EP - 403
JO - Thin Solid Films
JF - Thin Solid Films
ER -