Degradation of pentacene deposited on gold, aluminum and parylene surfaces: Impact of pentacene thickness

V. H. Martinez-Landeros; G. Gutierrez-Heredia; F. S. Aguirre-Tostado; M. Sotelo-Lerma; B. E. Gnade; M. A. Quevedo-Lopez

doi:10.1016/j.tsf.2012.12.061

Degradation of pentacene deposited on gold, aluminum and parylene surfaces: Impact of pentacene thickness

V. H. Martinez-Landeros, G. Gutierrez-Heredia, F. S. Aguirre-Tostado, M. Sotelo-Lerma, B. E. Gnade, M. A. Quevedo-Lopez^*

^*Corresponding author for this work

Departamento de Investigación en Polímeros y Materiales

Research output: Contribution to journal › Article › peer-review

1 Scopus citations

Abstract

In this work, the impact of film thickness in thermally evaporated pentacene thin films and metal electrodes is studied. In particular, we report electrical performance and stability of un-encapsulated organic Schottky diodes. The chemical composition, surface morphology and ambient stability of the resulting films were also studied. The electrical measurements were carried out in vertical Schottky diodes and its performance and stability was evaluated as function of shelf life time. Oxygen was detected at the pentacene surface. This oxygen is the main cause of the diode degradation and attributed to diffusion of oxygen into the bulk of the pentacene films. Thicker pentacene films resulted in more stable for Schottky diodes.

Original language	English
Pages (from-to)	398-403
Number of pages	6
Journal	Thin Solid Films
Volume	531
DOIs	https://doi.org/10.1016/j.tsf.2012.12.061
State	Published - 2013

Bibliographical note

Funding Information:
This work was partially supported from AFOSR project FA9550-10-1-0183 and Conacyt Mexico ( 158281 ).

Keywords

Electrical performance
Film thickness
Pentacene
Schottky diodes

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10.1016/j.tsf.2012.12.061

Cite this

@article{f80f66a770214a84b2a6e421437fda7b,

title = "Degradation of pentacene deposited on gold, aluminum and parylene surfaces: Impact of pentacene thickness",

abstract = "In this work, the impact of film thickness in thermally evaporated pentacene thin films and metal electrodes is studied. In particular, we report electrical performance and stability of un-encapsulated organic Schottky diodes. The chemical composition, surface morphology and ambient stability of the resulting films were also studied. The electrical measurements were carried out in vertical Schottky diodes and its performance and stability was evaluated as function of shelf life time. Oxygen was detected at the pentacene surface. This oxygen is the main cause of the diode degradation and attributed to diffusion of oxygen into the bulk of the pentacene films. Thicker pentacene films resulted in more stable for Schottky diodes.",

keywords = "Electrical performance, Film thickness, Pentacene, Schottky diodes",

author = "Martinez-Landeros, {V. H.} and G. Gutierrez-Heredia and Aguirre-Tostado, {F. S.} and M. Sotelo-Lerma and Gnade, {B. E.} and Quevedo-Lopez, {M. A.}",

note = "Funding Information: This work was partially supported from AFOSR project FA9550-10-1-0183 and Conacyt Mexico ( 158281 ).",

year = "2013",

doi = "10.1016/j.tsf.2012.12.061",

language = "Ingl{\'e}s",

volume = "531",

pages = "398--403",

journal = "Thin Solid Films",

issn = "0040-6090",

publisher = "Elsevier",

}

TY - JOUR

T1 - Degradation of pentacene deposited on gold, aluminum and parylene surfaces

T2 - Impact of pentacene thickness

AU - Martinez-Landeros, V. H.

AU - Gutierrez-Heredia, G.

AU - Aguirre-Tostado, F. S.

AU - Sotelo-Lerma, M.

AU - Gnade, B. E.

AU - Quevedo-Lopez, M. A.

N1 - Funding Information: This work was partially supported from AFOSR project FA9550-10-1-0183 and Conacyt Mexico ( 158281 ).

PY - 2013

Y1 - 2013

N2 - In this work, the impact of film thickness in thermally evaporated pentacene thin films and metal electrodes is studied. In particular, we report electrical performance and stability of un-encapsulated organic Schottky diodes. The chemical composition, surface morphology and ambient stability of the resulting films were also studied. The electrical measurements were carried out in vertical Schottky diodes and its performance and stability was evaluated as function of shelf life time. Oxygen was detected at the pentacene surface. This oxygen is the main cause of the diode degradation and attributed to diffusion of oxygen into the bulk of the pentacene films. Thicker pentacene films resulted in more stable for Schottky diodes.

AB - In this work, the impact of film thickness in thermally evaporated pentacene thin films and metal electrodes is studied. In particular, we report electrical performance and stability of un-encapsulated organic Schottky diodes. The chemical composition, surface morphology and ambient stability of the resulting films were also studied. The electrical measurements were carried out in vertical Schottky diodes and its performance and stability was evaluated as function of shelf life time. Oxygen was detected at the pentacene surface. This oxygen is the main cause of the diode degradation and attributed to diffusion of oxygen into the bulk of the pentacene films. Thicker pentacene films resulted in more stable for Schottky diodes.

KW - Electrical performance

KW - Film thickness

KW - Pentacene

KW - Schottky diodes

UR - http://www.scopus.com/inward/record.url?scp=84875454973&partnerID=8YFLogxK

U2 - 10.1016/j.tsf.2012.12.061

DO - 10.1016/j.tsf.2012.12.061

M3 - Artículo

SN - 0040-6090

VL - 531

SP - 398

EP - 403

JO - Thin Solid Films

JF - Thin Solid Films

ER -

Degradation of pentacene deposited on gold, aluminum and parylene surfaces: Impact of pentacene thickness

Abstract

Bibliographical note

Keywords

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