Dependence of h-BN Film Thickness as Grown on Nickel Single-Crystal Substrates of Different Orientations

Harry Chou; Sarmita Majumder; Anupam Roy; Massimo Catalano; Pingping Zhuang; Manuel Quevedo-Lopez; Luigi Colombo; Sanjay K. Banerjee

doi:10.1021/acsami.8b16816

Dependence of h-BN Film Thickness as Grown on Nickel Single-Crystal Substrates of Different Orientations

Harry Chou, Sarmita Majumder, Anupam Roy, Massimo Catalano, Pingping Zhuang, Manuel Quevedo-Lopez, Luigi Colombo, Sanjay K. Banerjee

Research output: Contribution to journal › Article

3 Scopus citations

Original language	American English
Pages (from-to)	44862-44870
Number of pages	9
Journal	ACS Applied Materials and Interfaces
DOIs	https://doi.org/10.1021/acsami.8b16816
State	Published - 26 Dec 2018
Externally published	Yes

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10.1021/acsami.8b16816

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Chou, H., Majumder, S., Roy, A., Catalano, M., Zhuang, P., Quevedo-Lopez, M., Colombo, L., & Banerjee, S. K. (2018). Dependence of h-BN Film Thickness as Grown on Nickel Single-Crystal Substrates of Different Orientations. ACS Applied Materials and Interfaces, 44862-44870. https://doi.org/10.1021/acsami.8b16816

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Dependence of h-BN Film Thickness as Grown on Nickel Single-Crystal Substrates of Different Orientations. / Chou, Harry; Majumder, Sarmita; Roy, Anupam; Catalano, Massimo; Zhuang, Pingping; Quevedo-Lopez, Manuel; Colombo, Luigi; Banerjee, Sanjay K.

In: ACS Applied Materials and Interfaces, 26.12.2018, p. 44862-44870.

Research output: Contribution to journal › Article

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AU - Zhuang, Pingping

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AU - Colombo, Luigi

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