Design and characterization of a four-quadrant detector and its application to shape recovering system

A.V. Marquina, L.A. González, J.R. Noriega

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

1 Scopus citations

Abstract

This work describes the characterization of a quadrant-type silicon photodiode that detect visible light and is designed using CMOS integrated circuit technology, peaking in 550 nm wavelength. The quadrant detector (QD) derives photocurrents by projecting a spot of light on four photodiodes placed close to each other on a silicon common substrate. The photodetector is square shaped with 2.25 mm2 per active area by each quadrant and the size of the device is 9mm2. Its transition region between the adjacent cells had a narrow width of 30 μm. The technology to develop position sensitive detectors of four quadrant optimizing geometry to increase sensitivity is described. In addition, the performance on applying the QD to shape a recovering system is investigated.

Original languageEnglish
Title of host publicationProceedings of SPIE - The International Society for Optical Engineering
DOIs
StatePublished - 2006
EventInfrared and Photoelectronic Imagers and Detector Devices II - San Diego, CA, United States
Duration: 13 Aug 200614 Aug 2006

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume6294
ISSN (Print)0277-786X

Conference

ConferenceInfrared and Photoelectronic Imagers and Detector Devices II
Country/TerritoryUnited States
CitySan Diego, CA
Period13/08/0614/08/06

Keywords

  • Cmos technology
  • Four quadrant detector
  • Shape recovering system
  • Silicon substrate

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