| Original language | American English |
|---|---|
| Pages (from-to) | 131-142 |
| Number of pages | 12 |
| Journal | Materials Science in Semiconductor Processing |
| DOIs | |
| State | Published - 1 Jan 2019 |
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Detailed characterization of good-quality SnS thin films obtained by chemical solution deposition at different reaction temperatures. / Cabrera-German, D.; García-Valenzuela, J. A.; Cota-Leal, M.; Martínez-Gil, M.; Aceves, R.; Sotelo-Lerma, M.
In: Materials Science in Semiconductor Processing, 01.01.2019, p. 131-142.Research output: Contribution to journal › Article › Research › peer-review
TY - JOUR
T1 - Detailed characterization of good-quality SnS thin films obtained by chemical solution deposition at different reaction temperatures
AU - Cabrera-German, D.
AU - García-Valenzuela, J. A.
AU - Cota-Leal, M.
AU - Martínez-Gil, M.
AU - Aceves, R.
AU - Sotelo-Lerma, M.
PY - 2019/1/1
Y1 - 2019/1/1
U2 - 10.1016/j.mssp.2018.09.009
DO - 10.1016/j.mssp.2018.09.009
M3 - Article
SP - 131
EP - 142
JO - Materials Science in Semiconductor Processing
JF - Materials Science in Semiconductor Processing
SN - 1369-8001
ER -