Detailed characterization of good-quality SnS thin films obtained by chemical solution deposition at different reaction temperatures

D. Cabrera-German, J. A. García-Valenzuela, M. Cota-Leal, M. Martínez-Gil, R. Aceves, M. Sotelo-Lerma

Research output: Contribution to journal › Article › peer-review

12 Scopus citations

Original language	American English
Pages (from-to)	131-142
Number of pages	12
Journal	Materials Science in Semiconductor Processing
DOIs	https://doi.org/10.1016/j.mssp.2018.09.009 https://doi.org/10.1016/j.mssp.2018.09.009
State	Published - 1 Jan 2019

Access to Document

https://www.scopus.com/inward/record.uri?partnerID=HzOxMe3b&scp=85053422769&origin=inward

Fingerprint Dive into the research topics of 'Detailed characterization of good-quality SnS thin films obtained by chemical solution deposition at different reaction temperatures'. Together they form a unique fingerprint.

Cite this

Cabrera-German, D., García-Valenzuela, J. A., Cota-Leal, M., Martínez-Gil, M., Aceves, R., & Sotelo-Lerma, M. (2019). Detailed characterization of good-quality SnS thin films obtained by chemical solution deposition at different reaction temperatures. Materials Science in Semiconductor Processing, 131-142. https://doi.org/10.1016/j.mssp.2018.09.009, https://doi.org/10.1016/j.mssp.2018.09.009

@article{021bb21a88e34420af36ed26abe62c6d,

title = "Detailed characterization of good-quality SnS thin films obtained by chemical solution deposition at different reaction temperatures",

author = "D. Cabrera-German and Garc{\'i}a-Valenzuela, {J. A.} and M. Cota-Leal and M. Mart{\'i}nez-Gil and R. Aceves and M. Sotelo-Lerma",

year = "2019",

month = jan,

day = "1",

doi = "10.1016/j.mssp.2018.09.009",

language = "American English",

pages = "131--142",

journal = "Materials Science in Semiconductor Processing",

issn = "1369-8001",

publisher = "Elsevier Ltd",

}

Cabrera-German, D, García-Valenzuela, JA, Cota-Leal, M, Martínez-Gil, M, Aceves, R & Sotelo-Lerma, M 2019, 'Detailed characterization of good-quality SnS thin films obtained by chemical solution deposition at different reaction temperatures', Materials Science in Semiconductor Processing, pp. 131-142. https://doi.org/10.1016/j.mssp.2018.09.009, https://doi.org/10.1016/j.mssp.2018.09.009

Detailed characterization of good-quality SnS thin films obtained by chemical solution deposition at different reaction temperatures. / Cabrera-German, D.; García-Valenzuela, J. A.; Cota-Leal, M.; Martínez-Gil, M.; Aceves, R.; Sotelo-Lerma, M.

In: Materials Science in Semiconductor Processing, 01.01.2019, p. 131-142.

Research output: Contribution to journal › Article › peer-review

TY - JOUR

T1 - Detailed characterization of good-quality SnS thin films obtained by chemical solution deposition at different reaction temperatures

AU - Cabrera-German, D.

AU - García-Valenzuela, J. A.

AU - Cota-Leal, M.

AU - Martínez-Gil, M.

AU - Aceves, R.

AU - Sotelo-Lerma, M.

PY - 2019/1/1

Y1 - 2019/1/1

U2 - 10.1016/j.mssp.2018.09.009

DO - 10.1016/j.mssp.2018.09.009

M3 - Article

SP - 131

EP - 142

JO - Materials Science in Semiconductor Processing

JF - Materials Science in Semiconductor Processing

SN - 1369-8001

ER -

Cabrera-German D, García-Valenzuela JA, Cota-Leal M, Martínez-Gil M, Aceves R , Sotelo-Lerma M. Detailed characterization of good-quality SnS thin films obtained by chemical solution deposition at different reaction temperatures. Materials Science in Semiconductor Processing. 2019 Jan 1;131-142. https://doi.org/10.1016/j.mssp.2018.09.009, https://doi.org/10.1016/j.mssp.2018.09.009