Electrical characterization of process induced effects on non-silicon devices

Chadwin D. Young, Pavel Bolshakov, Rodolfo A. Rodriguez-Davila, Peng Zhao, Ava Khosravi, Israel Mejia, Manuel Quevedo-Lopez, Christopher L. Hinkle, Robert M. Wallace

Research output: Contribution to conferencePaper

Original languageAmerican English
Pages173-176
Number of pages4
DOIs
StatePublished - 27 Jun 2018
Externally publishedYes
EventICICDT 2018 - International Conference on IC Design and Technology, Proceedings -
Duration: 27 Jun 2018 → …

Conference

ConferenceICICDT 2018 - International Conference on IC Design and Technology, Proceedings
Period27/06/18 → …

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  • Cite this

    Young, C. D., Bolshakov, P., Rodriguez-Davila, R. A., Zhao, P., Khosravi, A., Mejia, I., Quevedo-Lopez, M., Hinkle, C. L., & Wallace, R. M. (2018). Electrical characterization of process induced effects on non-silicon devices. 173-176. Paper presented at ICICDT 2018 - International Conference on IC Design and Technology, Proceedings, . https://doi.org/10.1109/ICICDT.2018.8399784