Electrical characterization of process induced effects on non-silicon devices

Chadwin D. Young, Pavel Bolshakov, Rodolfo A. Rodriguez-Davila, Peng Zhao, Ava Khosravi, Israel Mejia, Manuel Quevedo-Lopez, Christopher L. Hinkle, Robert M. Wallace

Research output: Contribution to conferencePaper

Original languageAmerican English
Pages173-176
Number of pages4
DOIs
StatePublished - 27 Jun 2018
Externally publishedYes
EventICICDT 2018 - International Conference on IC Design and Technology, Proceedings -
Duration: 27 Jun 2018 → …

Conference

ConferenceICICDT 2018 - International Conference on IC Design and Technology, Proceedings
Period27/06/18 → …

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