Electrical characterization of process induced effects on non-silicon devices

Chadwin D. Young, Pavel Bolshakov, Rodolfo A. Rodriguez-Davila, Peng Zhao, Ava Khosravi, Israel Mejia, Manuel Quevedo-Lopez, Christopher L. Hinkle, Robert M. Wallace

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

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Engineering & Materials Science