Electrical properties of p-type ZnTe thin films by immersion in Cu solution

G. Lastra, P. A. Luque, M. A. Quevedo-Lopez, A. Olivas

Research output: Contribution to journalArticleResearchpeer-review

9 Citations (Scopus)
Original languageAmerican English
Pages (from-to)271-273
Number of pages3
JournalMaterials Letters
DOIs
StatePublished - 1 Jul 2014
Externally publishedYes

Fingerprint

submerging
Electric properties
electrical properties
Thin films
Copper
thin films
copper
Hall mobility
Sheet resistance
Photolithography
Thin film transistors
Contact resistance
photolithography
Pulsed laser deposition
contact resistance
pulsed laser deposition
transistors
atmospheres
X ray diffraction
Temperature

Cite this

Lastra, G. ; Luque, P. A. ; Quevedo-Lopez, M. A. ; Olivas, A. / Electrical properties of p-type ZnTe thin films by immersion in Cu solution. In: Materials Letters. 2014 ; pp. 271-273.
@article{f7672703d3754fd0911d5bf775993bc2,
title = "Electrical properties of p-type ZnTe thin films by immersion in Cu solution",
author = "G. Lastra and Luque, {P. A.} and Quevedo-Lopez, {M. A.} and A. Olivas",
year = "2014",
month = "7",
day = "1",
doi = "10.1016/j.matlet.2014.04.058",
language = "American English",
pages = "271--273",
journal = "Materials Letters",
issn = "0167-577X",
publisher = "Elsevier",

}

Electrical properties of p-type ZnTe thin films by immersion in Cu solution. / Lastra, G.; Luque, P. A.; Quevedo-Lopez, M. A.; Olivas, A.

In: Materials Letters, 01.07.2014, p. 271-273.

Research output: Contribution to journalArticleResearchpeer-review

TY - JOUR

T1 - Electrical properties of p-type ZnTe thin films by immersion in Cu solution

AU - Lastra, G.

AU - Luque, P. A.

AU - Quevedo-Lopez, M. A.

AU - Olivas, A.

PY - 2014/7/1

Y1 - 2014/7/1

U2 - 10.1016/j.matlet.2014.04.058

DO - 10.1016/j.matlet.2014.04.058

M3 - Article

SP - 271

EP - 273

JO - Materials Letters

JF - Materials Letters

SN - 0167-577X

ER -