Electrical transport characterization of Al and Sn doped Mg<inf>2</inf>Si thin films

Bo Zhang, Tao Zheng, Ce Sun, Zaibing Guo, Moon J. Kim, Husam N. Alshareef, Manuel Quevedo-Lopez, Bruce E. Gnade

Research output: Contribution to journalArticle

6 Scopus citations
Original languageAmerican English
Pages (from-to)156-160
Number of pages5
JournalJournal of Alloys and Compounds
DOIs
StatePublished - 1 Jan 2017
Externally publishedYes

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