Electrical transport characterization of Al and Sn doped Mg2Si thin films

Bo Zhang, Tao Zheng, Ce Sun, Zaibing Guo, Moon J. Kim, Husam N. Alshareef, Manuel Quevedo-Lopez, Bruce E. Gnade*

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

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Engineering & Materials Science

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