Abstract
The emission band from a Eu2+ ions in a four films system is measured. The films are MgF2 /Al /MgF2 /Al and are deposited on a Al substrate. © 2010.Optical Society of America.
Original language | American English |
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State | Published - 1 Dec 2010 |
Event | Optics InfoBase Conference Papers - Duration: 1 Dec 2010 → … |
Conference
Conference | Optics InfoBase Conference Papers |
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Period | 1/12/10 → … |