The emission band from a Eu2+ ions in a four films system is measured. The films are MgF2 /Al /MgF2 /Al and are deposited on a Al substrate. © 2010.Optical Society of America.
|Original language||American English|
|State||Published - 1 Dec 2010|
|Event||Optics InfoBase Conference Papers - |
Duration: 1 Dec 2010 → …
|Conference||Optics InfoBase Conference Papers|
|Period||1/12/10 → …|