TY - GEN
T1 - Eu luminescence from a metallo-dielectric system
AU - Ramírez-Duverger, Aldo S.
AU - García-Llamas, Raúl
AU - Aceves, R.
AU - Gaspar-Armenta, Jorge A.
PY - 2010
Y1 - 2010
N2 - The emission band from a Eu2+ ions in a four films system is measured. The films are MgF2 /Al /MgF2 /Al and are deposited on a Al substrate.
AB - The emission band from a Eu2+ ions in a four films system is measured. The films are MgF2 /Al /MgF2 /Al and are deposited on a Al substrate.
UR - http://www.scopus.com/inward/record.url?scp=85086612873&partnerID=8YFLogxK
U2 - 10.1364/oic.2010.tha11
DO - 10.1364/oic.2010.tha11
M3 - Contribución a la conferencia
AN - SCOPUS:85086612873
SN - 9781557528919
T3 - Optics InfoBase Conference Papers
BT - Optical Interference Coatings, OIC 2010
PB - Optical Society of America (OSA)
T2 - Optical Interference Coatings, OIC 2010
Y2 - 6 June 2010 through 11 June 2010
ER -