Evolution of the optical and structural properties in ZnS/MgS2 multilayers as the number of layers increases

D. Soto*, F. Perales, G. Lifante, C. De Las Heras

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

1 Scopus citations

Abstract

A multiple sample holder has been designed to obtain multilayer samples of ZnS and MgF2, with different numbers of layers in the same evaporation process. The grown samples were optically analysed by measuring the transmittance in the Vis-NIR range, from where the complex refractive index is extracted by using a parametric program of fitting. The properties of the multilayers have been studied in relation to the number of layers, and also in relation to the first deposited layer material on the substrate. It has been found that the transmittance minimum diminishes and goes to higher wavelengths as the number of layers increases. Also, variations on the structure of both ZnS and MgF2 materials were observed by x-ray diffraction, and were correlated with the number of layers of the sample.

Original languageEnglish
Article number215402
JournalJournal of Physics D: Applied Physics
Volume42
Issue number21
DOIs
StatePublished - 2009

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