Hot-carrier- and constant-voltage-stress-induced low-frequency noise in nitrided high-k dielectric MOSFETs

M. Shahriar Rahman, Tanvir Hasan Morshed, Zeynep Çelik-Butler, M. A. Quevedo-Lopez, A. Shanware, Luigi Colombo

Research output: Contribution to journalArticle

3 Scopus citations
Original languageAmerican English
Pages (from-to)203-208
Number of pages6
JournalIEEE Transactions on Device and Materials Reliability
DOIs
StatePublished - 1 Jun 2009
Externally publishedYes

Fingerprint Dive into the research topics of 'Hot-carrier- and constant-voltage-stress-induced low-frequency noise in nitrided high-k dielectric MOSFETs'. Together they form a unique fingerprint.

  • Cite this