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Hot-carrier- and constant-voltage-stress-induced low-frequency noise in nitrided high-k dielectric MOSFETs
M. Shahriar Rahman, Tanvir Hasan Morshed, Zeynep Çelik-Butler, M. A. Quevedo-Lopez, A. Shanware, Luigi Colombo
Research output: Contribution to journal › Article › peer-review
4
Scopus
citations