@conference{90d028532d2742b8aec98a80a3e1bc04,
title = "Hot carrier stress investigation of zinc oxide thin film transistors with an al2o3 gate dielectric",
author = "Rodriguez-Davila, {Rodolfo A.} and Israel Mejia and Manuel Quevedo-Lopez and Young, {Chadwin D.}",
year = "2018",
month = aug,
day = "30",
doi = "10.1109/IPFA.2018.8452171",
language = "American English",
note = "Proceedings of the International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA ; Conference date: 30-08-2018",
}