Hot carrier stress investigation of zinc oxide thin film transistors with an al2o3 gate dielectric

Rodolfo A. Rodriguez-Davila, Israel Mejia, Manuel Quevedo-Lopez, Chadwin D. Young

Research output: Contribution to conferencePaper

4 Scopus citations
Original languageAmerican English
DOIs
StatePublished - 30 Aug 2018
Externally publishedYes
EventProceedings of the International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA -
Duration: 30 Aug 2018 → …

Conference

ConferenceProceedings of the International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA
Period30/08/18 → …

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