Impact of Al<inf>2</inf>O<inf>3</inf> deposition temperature on the performance and initial stability of nanocrystalline ZnO thin-film transistors

R. A. Rodriguez-Davila, R. A. Chapman, P. Bolshakov, C. D. Young, M. Quevedo-Lopez

Research output: Contribution to journalArticle

1 Scopus citations
Original languageAmerican English
JournalMicroelectronic Engineering
DOIs
StatePublished - 15 Sep 2019
Externally publishedYes

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