Impact of semiconductor/contact metal thickness ratio on organic thin-film transistor performance

S. Gowrisanker, Y. Ai, M. A. Quevedo-Lopez, H. Jia, H. N. Alshareef, E. Vogel, B. Gnade

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@article{4e3750a1ae3943ec8cee9c9e5fe512ce,

title = "Impact of semiconductor/contact metal thickness ratio on organic thin-film transistor performance",

author = "S. Gowrisanker and Y. Ai and Quevedo-Lopez, {M. A.} and H. Jia and Alshareef, {H. N.} and E. Vogel and B. Gnade",

year = "2008",

month = apr,

day = "24",

doi = "10.1063/1.2904968",

language = "American English",

journal = "Applied Physics Letters",

issn = "0003-6951",

publisher = "American Institute of Physics",

}

TY - JOUR

T1 - Impact of semiconductor/contact metal thickness ratio on organic thin-film transistor performance

AU - Gowrisanker, S.

AU - Ai, Y.

AU - Quevedo-Lopez, M. A.

AU - Jia, H.

AU - Alshareef, H. N.

AU - Vogel, E.

AU - Gnade, B.

PY - 2008/4/24

Y1 - 2008/4/24

U2 - 10.1063/1.2904968

DO - 10.1063/1.2904968

M3 - Article

JO - Applied Physics Letters

JF - Applied Physics Letters

SN - 0003-6951

ER -