Indicators of mobility extraction error in bottom gate CdS metal-oxide-semiconductor field-effect transistors

Ukjin Jung, Young Gon Lee, Jin Ju Kim, Sang Kyung Lee, I. Mejia, A. Salas-Villasenor, Manuel Quevedo-Lopez, Byoung Hun Lee

Research output: Contribution to journalArticle

3 Scopus citations
Original languageAmerican English
JournalApplied Physics Letters
DOIs
StatePublished - 29 Oct 2012
Externally publishedYes

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