Interaction between a guided mode and a surface nano defect

Javier Durán-Favela, Jorge Gaspar-Armenta, Raúl D. García-Llamas*, José Valenzuela-Benavides

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review


The electromagnetic near-field produced by the interaction between a transverse electric guided mode and a surface nano-defect in a planar structure is studied. A Fourier Transform technique is used to obtain the surface defect profile.

Original languageEnglish
Title of host publicationOptical Interference Coatings, OIC 2004
PublisherOptica Publishing Group (formerly OSA)
ISBN (Electronic)3540003649
StatePublished - 2004
EventOptical Interference Coatings, OIC 2004 - Tucson, United States
Duration: 27 Jun 20042 Jul 2004

Publication series

NameOptics InfoBase Conference Papers
ISSN (Electronic)2162-2701


ConferenceOptical Interference Coatings, OIC 2004
Country/TerritoryUnited States

Bibliographical note

Publisher Copyright:
© 2004 OSA - The Optical Society. All rights reserved.


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