Interaction between a guided mode and a surface nano defect

Javier Durán-Favela; Jorge Gaspar-Armenta; Raúl D. García-Llamas; José Valenzuela-Benavides

Interaction between a guided mode and a surface nano defect

Javier Durán-Favela, Jorge Gaspar-Armenta, Raúl D. García-Llamas^*, José Valenzuela-Benavides

^*Corresponding author for this work

Departamento de Investigación en Física

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

Abstract

The electromagnetic near-field produced by the interaction between a transverse electric guided mode and a surface nano-defect in a planar structure is studied. A Fourier Transform technique is used to obtain the surface defect profile.

Original language	English
Title of host publication	Optical Interference Coatings, OIC 2004
Publisher	Optica Publishing Group (formerly OSA)
ISBN (Electronic)	3540003649
State	Published - 2004
Event	Optical Interference Coatings, OIC 2004 - Tucson, United States Duration: 27 Jun 2004 → 2 Jul 2004

Publication series

Name	Optics InfoBase Conference Papers
ISSN (Electronic)	2162-2701

Conference

Conference	Optical Interference Coatings, OIC 2004
Country/Territory	United States
City	Tucson
Period	27/06/04 → 2/07/04

Bibliographical note

Publisher Copyright:
© 2004 OSA - The Optical Society. All rights reserved.

Cite this

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title = "Interaction between a guided mode and a surface nano defect",

abstract = "The electromagnetic near-field produced by the interaction between a transverse electric guided mode and a surface nano-defect in a planar structure is studied. A Fourier Transform technique is used to obtain the surface defect profile.",

author = "Javier Dur{\'a}n-Favela and Jorge Gaspar-Armenta and Garc{\'i}a-Llamas, {Ra{\'u}l D.} and Jos{\'e} Valenzuela-Benavides",

year = "2004",

language = "Ingl{\'e}s",

series = "Optics InfoBase Conference Papers",

publisher = "Optica Publishing Group (formerly OSA)",

booktitle = "Optical Interference Coatings, OIC 2004",

}

TY - GEN

T1 - Interaction between a guided mode and a surface nano defect

AU - Durán-Favela, Javier

AU - Gaspar-Armenta, Jorge

AU - García-Llamas, Raúl D.

AU - Valenzuela-Benavides, José

PY - 2004

Y1 - 2004

N2 - The electromagnetic near-field produced by the interaction between a transverse electric guided mode and a surface nano-defect in a planar structure is studied. A Fourier Transform technique is used to obtain the surface defect profile.

AB - The electromagnetic near-field produced by the interaction between a transverse electric guided mode and a surface nano-defect in a planar structure is studied. A Fourier Transform technique is used to obtain the surface defect profile.

UR - http://www.scopus.com/inward/record.url?scp=85135960421&partnerID=8YFLogxK

M3 - Contribución a la conferencia

AN - SCOPUS:85135960421

T3 - Optics InfoBase Conference Papers

BT - Optical Interference Coatings, OIC 2004

PB - Optica Publishing Group (formerly OSA)

T2 - Optical Interference Coatings, OIC 2004

Y2 - 27 June 2004 through 2 July 2004

ER -

Interaction between a guided mode and a surface nano defect

Abstract

Publication series

Conference

Bibliographical note

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Cite this