Investigation of electrical, magneto-dielectric and transport properties of multiferroic (1−x) BiFeO3-(x) BaSr0.7Ti0.3O3 solid solutions

Subhash Sharma; M.P. Cruz; J. M. Siqueiros; O Raymond-Herrera; Victor Emanuel Álvarez Montaño; R.K. Dewivedi

doi:10.1007/s10854-019-01058-w

Investigation of electrical, magneto-dielectric and transport properties of multiferroic (1−x) BiFeO3-(x) BaSr0.7Ti0.3O3 solid solutions

Subhash Sharma, M.P. Cruz, J. M. Siqueiros, O Raymond-Herrera, Victor Emanuel Álvarez Montaño, R.K. Dewivedi

Departamento de Ingenería Química y Metalurgia

Research output: Contribution to journal › Article › peer-review

3 Scopus citations

Original language	Undefined/Unknown
Journal	Journal of Materials Science: Materials in Electronics
DOIs	https://doi.org/10.1007/s10854-019-01058-w
State	Published - 2019

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10.1007/s10854-019-01058-w

https://doi.org/10.1007/s10854-019-01058-w

Cite this

@article{eef2ca066b904c13a36bd0a82395dffc,

title = "Investigation of electrical, magneto-dielectric and transport properties of multiferroic (1−x) BiFeO3-(x) BaSr0.7Ti0.3O3 solid solutions",

author = "Subhash Sharma and M.P. Cruz and Siqueiros, {J. M.} and O Raymond-Herrera and {{\'A}lvarez Monta{\~n}o}, {Victor Emanuel} and R.K. Dewivedi",

year = "2019",

doi = "10.1007/s10854-019-01058-w",

language = "Indefinido/desconocido",

journal = "Journal of Materials Science: Materials in Electronics",

issn = "0957-4522",

publisher = "Springer New York",

}

Investigation of electrical, magneto-dielectric and transport properties of multiferroic (1−x) BiFeO3-(x) BaSr0.7Ti0.3O3 solid solutions. / Sharma, Subhash; Cruz, M.P.; Siqueiros, J. M.; Raymond-Herrera, O; Álvarez Montaño, Victor Emanuel; Dewivedi, R.K.

In: Journal of Materials Science: Materials in Electronics, 2019.

Research output: Contribution to journal › Article › peer-review

TY - JOUR

T1 - Investigation of electrical, magneto-dielectric and transport properties of multiferroic (1−x) BiFeO3-(x) BaSr0.7Ti0.3O3 solid solutions

AU - Sharma, Subhash

AU - Cruz, M.P.

AU - Siqueiros, J. M.

AU - Raymond-Herrera, O

AU - Álvarez Montaño, Victor Emanuel

AU - Dewivedi, R.K.

PY - 2019

Y1 - 2019

UR - https://doi.org/10.1007/s10854-019-01058-w

U2 - 10.1007/s10854-019-01058-w

DO - 10.1007/s10854-019-01058-w

M3 - Artículo

JO - Journal of Materials Science: Materials in Electronics

JF - Journal of Materials Science: Materials in Electronics

SN - 0957-4522

ER -