Engineering & Materials Science
Annealing
28%
Atomic layer deposition
43%
Capacitors
22%
Chemical activation
25%
Elastic moduli
23%
Electric breakdown
31%
Gallium
40%
Gases
16%
Gate dielectrics
40%
Hafnium oxides
100%
High-k dielectric
44%
Indium
36%
Leakage currents
30%
Oxide films
35%
Permittivity
28%
Polymers
41%
Shape-memory polymer
80%
Substrates
40%
Temperature
11%
Thermosets
34%
Thin film devices
94%
Thin film transistors
72%
Zinc oxide
37%
Physics & Astronomy
acrylates
17%
activation
11%
annealing
8%
atomic layer epitaxy
14%
breakdown
11%
capacitors
12%
gallium oxides
18%
gases
7%
hafnium oxides
77%
indium
13%
leakage
11%
life (durability)
38%
permittivity
9%
polymers
33%
projection
11%
softening
55%
stimuli
13%
temperature
4%
thin films
29%
thiols
17%
transistors
22%
zinc oxides
13%
Chemistry
Acrylate
12%
Annealing
11%
Atomic Layer Epitaxy
16%
Capacitor
14%
Compound Mobility
10%
Dielectric Constant
12%
Dielectric Material
50%
Dimension
32%
Gas
7%
Hafnium Atom
67%
Leakage Current
18%
Liquid Film
6%
Oxide
30%
Shape
37%
Storage Modulus
15%