Abstract
An integral equation relating the reflected field to the incident plane wave was found based on Rayleigh's method. The differential reflection coefficient (DRC) is calculated for the case of the incoherent scattered intensity. Results are obtained for a bilayer system with a random shallow rough interface with vacuum and applied to the attenuated total reflection (ATR) configuration. In the angular dependence of the incoherent DRC, five peaks are detected, corresponding to the enhanced backscattering peak which is a multiple scattering effect, and four other satellite peaks caused by single scattering effects. The peaks are associated to the excitation of guided wave in the dielectric film.
Original language | English |
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Pages (from-to) | 653-654 |
Number of pages | 2 |
Journal | Proceedings of SPIE - The International Society for Optical Engineering |
Volume | 3749 |
State | Published - 1999 |
Event | Proceedings of the 1999 18th Congress of the International Commission for Optics (ICO XVIII): Optics for the Next Millennium - San Francisco, CA, USA Duration: 2 Aug 1999 → 6 Aug 1999 |