Low frequency noise degradation in 45 nm high-k nMOSFETs due to hot carrier and constant voltage stress

M. Shahriar Rahman, Zeynep Çelik-Butler, Manuel M.A. Quevedo-Lopez, Ajit Shanware, Luigi Colombo

Research output: Contribution to conferencePaper

Original languageAmerican English
Pages263-266
Number of pages4
DOIs
StatePublished - 20 Jul 2009
Externally publishedYes
EventAIP Conference Proceedings -
Duration: 20 Jul 2009 → …

Conference

ConferenceAIP Conference Proceedings
Period20/07/09 → …

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    Rahman, M. S., Zeynep Çelik-Butler, M.A. Quevedo-Lopez, M., Shanware, A., & Colombo, L. (2009). Low frequency noise degradation in 45 nm high-k nMOSFETs due to hot carrier and constant voltage stress. 263-266. Paper presented at AIP Conference Proceedings, . https://doi.org/10.1063/1.3140447