Original language | American English |
---|---|
Pages (from-to) | 3936-3943 |
Number of pages | 8 |
Journal | IEEE Transactions on Electron Devices |
DOIs | |
State | Published - 1 Oct 2016 |
Externally published | Yes |
Nanocrystalline ZnO TFTs Using 15-nm Thick Al<inf>2</inf>O<inf>3</inf>Gate Insulator: Experiment and Simulation
Richard A. Chapman, Rodolfo A. Rodriguez-Davila, Israel Mejia, Manuel Quevedo-Lopez
Research output: Contribution to journal › Article › peer-review
7
Scopus
citations