Nanocrystalline ZnO TFTs Using 15-nm Thick Al<inf>2</inf>O<inf>3</inf>Gate Insulator: Experiment and Simulation

Richard A. Chapman, Rodolfo A. Rodriguez-Davila, Israel Mejia, Manuel Quevedo-Lopez

Research output: Contribution to journalArticle

7 Scopus citations
Original languageAmerican English
Pages (from-to)3936-3943
Number of pages8
JournalIEEE Transactions on Electron Devices
DOIs
StatePublished - 1 Oct 2016
Externally publishedYes

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