Optical response and light scattering measurements from a planar guided wave

Raúl García-Llamas*, Aldo S. Ramírez-Duverger, Jorge Gaspar-Armenta, Raúl Aceves-Torres

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

Experimental results of reflection and light scattering measurements using the technique of attenuated total reflection (ATR) in the Kretschmann configuration of a system when it is excited an electromagnetic guided mode are reported. The system used is BK7 glass-prism/Dielectric1/Dielectric2/ Dielectric1/air, where the refractive index of dielectricl is less than the refractive index of the dielectric2. It was found a dip in the specular reflection as a function of the incident angle due to the excitation of a guided mode in the dielectric2 film. The guided mode was found for s polarization of the incident light. The angular dependence of the scattered light displays a peak caused by single-scattering and located approximately at the angles of excitation of the guided modes whose normalized wave numbers are less than the refractive index of the glass. Values of thickness, refractive index and absorption index obtained from Lorentz dispersion model of the film are reported.

Original languageEnglish
Title of host publicationAdvances in Thin-Film Coatings for Optical Applications III
DOIs
StatePublished - 2006
EventAdvances in Thin-Film Coatings for Optical Applications III - San Diego, CA, United States
Duration: 13 Aug 200614 Aug 2006

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume6286
ISSN (Print)0277-786X

Conference

ConferenceAdvances in Thin-Film Coatings for Optical Applications III
Country/TerritoryUnited States
CitySan Diego, CA
Period13/08/0614/08/06

Keywords

  • Electromagnetic wave optics
  • Scattering thin films
  • Thin films

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