PMMA-SiO<inf>2</inf>hybrid films as gate dielectric for ZnO based thin-film transistors

M. D. Morales-Acosta, M. A. Quevedo-López, R. Ramírez-Bon

Research output: Contribution to journalArticlepeer-review

36 Scopus citations

Abstract

In this paper we report a low temperature sol-gel deposition process of PMMA-SiO2hybrid films, with variable dielectric properties depending on the composition of the precursor solution, for applications to gate dielectric layers in field-effect thin film transistors (FE-TFT). The hybrid layers were processed by a modified sol-gel route using as precursors Tetraethyl orthosilicate (TEOS) and Methyl methacrylate (MMA), and 3-(Trimethoxysilyl) propyl methacrylate (TMSPM) as the coupling agent. Three types of hybrid films were processed with molar ratios of the precursors in the initial solution 1.0: 0.25, 0.50, 0.75: 1.0 for TEOS: TMSPM: MMA, respectively. The hybrid films were deposited by spin coating of the hybrid precursor solutions onto p-type Si (100) substrates and heat-treated at 90 °C for 24 h. The chemical bonding in the hybrid films was analyzed by Fourier Transform Infrared Spectroscopy to confirm their hybrid nature. The refractive index of the hybrid films as a function of the TMSPM coupling agent concentration, were determined from a simultaneous analysis of optical reflectance and spectroscopic ellipsometry experimental data. The PMMA-SiO2hybrid films were studied as dielectric films using metal-insulator-metal structures. Capacitance-Voltage (C-V) and current-voltage (I-V) electrical methods were used to extract the dielectric properties of the different hybrid layers. The three types of hybrid films were tested as gate dielectric layers in thin film transistors with structure ZnO/PMMA-SiO2/p-Si with a common bottom gate and patterned Al source/drain contacts, with different channel lengths. We analyzed the output electrical responses of the ZnO-based TFTs to determine their performance parameters as a function of channel length and hybrid gate dielectric layer. © 2014 Elsevier B.V. All rights reserved.
Original languageAmerican English
Pages (from-to)380-388
Number of pages9
JournalMaterials Chemistry and Physics
DOIs
StatePublished - 14 Aug 2014
Externally publishedYes

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