Positive Bias Instability in ZnO TFTs with Al2O3 Gate Dielectric

Pavel Bolshakov, Rodolfo A. Rodriguez-Davila, Manuel Quevedo-Lopez, Chadwin D. Young

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

2 Scopus citations

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Material Science

Earth and Planetary Sciences

Physics

Engineering

Chemical Engineering