PVP-SiO<inf>2</inf> and PVP-TiO<inf>2</inf> hybrid films for dielectric gate applications in CdS-based thin film transistors

M. S. de Urquijo-Ventura, M. G.Syamala Rao, S. Meraz-Davila, J. A.Torres Ochoa, M. A. Quevedo-Lopez, R. Ramirez-Bon

Research output: Contribution to journalArticle

Original languageAmerican English
JournalPolymer
DOIs
StatePublished - 16 Mar 2020
Externally publishedYes

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