PVP-SiO₂ and PVP-TiO₂ hybrid films for dielectric gate applications in CdS-based thin film transistors

M. S. de Urquijo-Ventura, M. G.Syamala Rao^*, S. Meraz-Davila, J. A.Torres Ochoa, M. A. Quevedo-Lopez, R. Ramirez-Bon

^*Corresponding author for this work

Research output: Contribution to journal › Article › peer-review