PVP-SiO2 and PVP-TiO2 hybrid films for dielectric gate applications in CdS-based thin film transistors

M. S. de Urquijo-Ventura, M. G.Syamala Rao*, S. Meraz-Davila, J. A.Torres Ochoa, M. A. Quevedo-Lopez, R. Ramirez-Bon

*Corresponding author for this work

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Engineering & Materials Science

Chemistry