Relatively low-temperature processing and its impact on device performance and reliability

C. D. Young, P. Bolshakov, R. A. Rodriguez Davila, P. Zhao, C. Smyth, M. Quevedo-Lopez, R. M. Wallace

Research output: Contribution to conferencePaper

Original languageAmerican English
Pages89-97
Number of pages9
DOIs
StatePublished - 1 Jan 2019
Externally publishedYes
EventECS Transactions -
Duration: 1 Jan 2019 → …

Conference

ConferenceECS Transactions
Period1/01/19 → …

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  • Cite this

    Young, C. D., Bolshakov, P., Rodriguez Davila, R. A., Zhao, P., Smyth, C., Quevedo-Lopez, M., & Wallace, R. M. (2019). Relatively low-temperature processing and its impact on device performance and reliability. 89-97. Paper presented at ECS Transactions, . https://doi.org/10.1149/09001.0089ecst