Relatively low-temperature processing and its impact on device performance and reliability

C. D. Young, P. Bolshakov, R. A. Rodriguez Davila, P. Zhao, C. Smyth, M. Quevedo-Lopez, R. M. Wallace

Research output: Contribution to conference › Paper

Original language	American English
Pages	89-97
Number of pages	9
DOIs	https://doi.org/10.1149/09001.0089ecst
State	Published - 1 Jan 2019
Externally published	Yes
Event	ECS Transactions - Duration: 1 Jan 2019 → …

Conference	ECS Transactions
Period	1/01/19 → …

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Young, C. D., Bolshakov, P., Rodriguez Davila, R. A., Zhao, P., Smyth, C., Quevedo-Lopez, M., & Wallace, R. M. (2019). Relatively low-temperature processing and its impact on device performance and reliability. 89-97. Paper presented at ECS Transactions, . https://doi.org/10.1149/09001.0089ecst

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