Resonant scattering of light measurements from a system with rough interfaces that supports guided modes

Aldo S. Ramírez-Duverger; Jorge A. Gaspar-Armenta; Raúl García-Llamas

doi:10.1117/12.450896

Resonant scattering of light measurements from a system with rough interfaces that supports guided modes

Aldo S. Ramírez-Duverger^*, Jorge A. Gaspar-Armenta, Raúl García-Llamas

^*Corresponding author for this work

Departamento de Investigación en Física

Research output: Contribution to journal › Conference article › peer-review

Abstract

We reported experimental results of the resonant scattering of light from a system prism-glass/Ag/MgF₂/air in the ATR-Kretschmann configuration, for p-polarized light incident by the glass side. The thickness of the dielectric film is chosen in such a way that in the absence of roughness the system supports 3 transverse magnetic (TM) guided modes, at a wavelength λ = 632.8 nm of the incident light. The scattering is due to the natural roughness of each interface of the system, while the resonant character of the scattering is due to the excitation of the guided modes and their interaction with the interfaces roughness. The scattered light shows six peaks at angles given by θ₁ = ± 61.65° θ₂ = ± 53.69°, and θ₃ = ± 43.40°, for any angle of incidence. These angles correspond to the excitation of the guided modes. The scattering response is enhanced when the angle of incidence is equal to one of the angles of excitation of the guided modes.

Original language	English
Pages (from-to)	35-40
Number of pages	6
Journal	Proceedings of SPIE - The International Society for Optical Engineering
Volume	4805
DOIs	https://doi.org/10.1117/12.450896
State	Published - 2002
Event	Design and Fabrication of Planar Optical Waveguide Devices and Materials - Seattle, WA, United States Duration: 8 Jul 2002 → 9 Jul 2002

Keywords

Guided modes
Roughness
Scattering
Thin films

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title = "Resonant scattering of light measurements from a system with rough interfaces that supports guided modes",

abstract = "We reported experimental results of the resonant scattering of light from a system prism-glass/Ag/MgF2/air in the ATR-Kretschmann configuration, for p-polarized light incident by the glass side. The thickness of the dielectric film is chosen in such a way that in the absence of roughness the system supports 3 transverse magnetic (TM) guided modes, at a wavelength λ = 632.8 nm of the incident light. The scattering is due to the natural roughness of each interface of the system, while the resonant character of the scattering is due to the excitation of the guided modes and their interaction with the interfaces roughness. The scattered light shows six peaks at angles given by θ1 = ± 61.65° θ2 = ± 53.69°, and θ3 = ± 43.40°, for any angle of incidence. These angles correspond to the excitation of the guided modes. The scattering response is enhanced when the angle of incidence is equal to one of the angles of excitation of the guided modes.",

keywords = "Guided modes, Roughness, Scattering, Thin films",

author = "Ram{\'i}rez-Duverger, {Aldo S.} and Gaspar-Armenta, {Jorge A.} and Ra{\'u}l Garc{\'i}a-Llamas",

year = "2002",

doi = "10.1117/12.450896",

language = "Ingl{\'e}s",

volume = "4805",

pages = "35--40",

journal = "Proceedings of SPIE - The International Society for Optical Engineering",

issn = "0277-786X",

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note = "Design and Fabrication of Planar Optical Waveguide Devices and Materials ; Conference date: 08-07-2002 Through 09-07-2002",

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T1 - Resonant scattering of light measurements from a system with rough interfaces that supports guided modes

AU - Ramírez-Duverger, Aldo S.

AU - Gaspar-Armenta, Jorge A.

AU - García-Llamas, Raúl

PY - 2002

Y1 - 2002

N2 - We reported experimental results of the resonant scattering of light from a system prism-glass/Ag/MgF2/air in the ATR-Kretschmann configuration, for p-polarized light incident by the glass side. The thickness of the dielectric film is chosen in such a way that in the absence of roughness the system supports 3 transverse magnetic (TM) guided modes, at a wavelength λ = 632.8 nm of the incident light. The scattering is due to the natural roughness of each interface of the system, while the resonant character of the scattering is due to the excitation of the guided modes and their interaction with the interfaces roughness. The scattered light shows six peaks at angles given by θ1 = ± 61.65° θ2 = ± 53.69°, and θ3 = ± 43.40°, for any angle of incidence. These angles correspond to the excitation of the guided modes. The scattering response is enhanced when the angle of incidence is equal to one of the angles of excitation of the guided modes.

AB - We reported experimental results of the resonant scattering of light from a system prism-glass/Ag/MgF2/air in the ATR-Kretschmann configuration, for p-polarized light incident by the glass side. The thickness of the dielectric film is chosen in such a way that in the absence of roughness the system supports 3 transverse magnetic (TM) guided modes, at a wavelength λ = 632.8 nm of the incident light. The scattering is due to the natural roughness of each interface of the system, while the resonant character of the scattering is due to the excitation of the guided modes and their interaction with the interfaces roughness. The scattered light shows six peaks at angles given by θ1 = ± 61.65° θ2 = ± 53.69°, and θ3 = ± 43.40°, for any angle of incidence. These angles correspond to the excitation of the guided modes. The scattering response is enhanced when the angle of incidence is equal to one of the angles of excitation of the guided modes.

KW - Guided modes

KW - Roughness

KW - Scattering

KW - Thin films

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U2 - 10.1117/12.450896

DO - 10.1117/12.450896

M3 - Artículo de la conferencia

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SN - 0277-786X

VL - 4805

SP - 35

EP - 40

JO - Proceedings of SPIE - The International Society for Optical Engineering

JF - Proceedings of SPIE - The International Society for Optical Engineering

T2 - Design and Fabrication of Planar Optical Waveguide Devices and Materials

Y2 - 8 July 2002 through 9 July 2002

ER -

Resonant scattering of light measurements from a system with rough interfaces that supports guided modes

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Keywords

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