Semi empirical cadmium sulfide transistor model combining grain defects and semiconductor thickness variation

Naga Surya Pasupuleti, Ron Pieper, Wudyalew Wondmagegn, Andrew L. Coogan, Israel Mejia, Ana Salas-Villasenor, Manuel Quevedo-Lopez

Research output: Contribution to conferencePaper

Original languageAmerican English
Pages6-11
Number of pages6
DOIs
StatePublished - 10 Jul 2013
Externally publishedYes
EventProceedings of the Annual Southeastern Symposium on System Theory -
Duration: 10 Jul 2013 → …

Conference

ConferenceProceedings of the Annual Southeastern Symposium on System Theory
Period10/07/13 → …

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  • Cite this

    Pasupuleti, N. S., Pieper, R., Wondmagegn, W., Coogan, A. L., Mejia, I., Salas-Villasenor, A., & Quevedo-Lopez, M. (2013). Semi empirical cadmium sulfide transistor model combining grain defects and semiconductor thickness variation. 6-11. Paper presented at Proceedings of the Annual Southeastern Symposium on System Theory, . https://doi.org/10.1109/SSST.2013.6524957