TY - JOUR
T1 - Sensitivity to thickness errors in the design of optical coatings
T2 - A method based on admittance diagrams
AU - Villa-Villa, Francisco
AU - Gaspar-Armenta, Jorge A.
AU - Reyes-Ramírez, Bartolome
N1 - Publisher Copyright:
© 2018 Society of Photo-Optical Instrumentation Engineers (SPIE).
PY - 2018/10/1
Y1 - 2018/10/1
N2 - We present a general analysis of thickness errors in multilayers using the classical existing methods, and adding a complimentary tool based on admittance perturbed circumferences that allow us to obtain a deeper insight into the spectral performance sensitivity due to each layer composing the system. An analysis of the standard deviation of reflectance based on perturbing the system with statistical thickness errors is considered. The proposed method represents a useful tool to study the sensitivity of any multilayer to determine the manufacturing feasibility in the design stage that can save a number of trial deposition experiments while setting up the manufacturing process of a given system. This fact is demonstrated by considering different classical systems with highly stable and instable spectral regions.
AB - We present a general analysis of thickness errors in multilayers using the classical existing methods, and adding a complimentary tool based on admittance perturbed circumferences that allow us to obtain a deeper insight into the spectral performance sensitivity due to each layer composing the system. An analysis of the standard deviation of reflectance based on perturbing the system with statistical thickness errors is considered. The proposed method represents a useful tool to study the sensitivity of any multilayer to determine the manufacturing feasibility in the design stage that can save a number of trial deposition experiments while setting up the manufacturing process of a given system. This fact is demonstrated by considering different classical systems with highly stable and instable spectral regions.
KW - interference coatings
KW - multilayer design
KW - thin films
UR - http://www.scopus.com/inward/record.url?scp=85055510829&partnerID=8YFLogxK
U2 - 10.1117/1.OE.57.10.105103
DO - 10.1117/1.OE.57.10.105103
M3 - Artículo
SN - 0091-3286
VL - 57
JO - Optical Engineering
JF - Optical Engineering
IS - 10
M1 - 105103
ER -