Slow trap charging and detrapping in the negative bias temperature instability in HfSiON dielectric based field effect transistors

R. A.B. Devine, H. N. Alshareef, M. A. Quevedo-Lopez

Research output: Contribution to journalArticlepeer-review

3 Scopus citations
Original languageAmerican English
JournalJournal of Applied Physics
DOIs
StatePublished - 1 Dec 2008
Externally publishedYes

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