Original language | American English |
---|---|
Pages (from-to) | 834-842 |
Number of pages | 9 |
Journal | Current Applied Physics |
DOIs | |
State | Published - 1 Jul 2018 |
Externally published | Yes |
Specific contact resistance of IGZO thin film transistors with metallic and transparent conductive oxides electrodes and XPS study of the contact/semiconductor interfaces
M. E. Rivas-Aguilar, N. Hernandez-Como, G. Gutierrez-Heredia, A. Sánchez-Martínez, M. Mireles Ramirez, I. Mejia, M. A. Quevedo-López
Research output: Contribution to journal › Article › peer-review
4
Scopus
citations