Specific contact resistance of IGZO thin film transistors with metallic and transparent conductive oxides electrodes and XPS study of the contact/semiconductor interfaces

M. E. Rivas-Aguilar; N. Hernandez-Como; G. Gutierrez-Heredia; A. Sánchez-Martínez; M. Mireles Ramirez; I. Mejia; M. A. Quevedo-López

doi:10.1016/j.cap.2018.04.002

Specific contact resistance of IGZO thin film transistors with metallic and transparent conductive oxides electrodes and XPS study of the contact/semiconductor interfaces

M. E. Rivas-Aguilar, N. Hernandez-Como, G. Gutierrez-Heredia, A. Sánchez-Martínez, M. Mireles Ramirez, I. Mejia, M. A. Quevedo-López

Research output: Contribution to journal › Article › peer-review

4 Scopus citations

Original language	American English
Pages (from-to)	834-842
Number of pages	9
Journal	Current Applied Physics
DOIs	https://doi.org/10.1016/j.cap.2018.04.002
State	Published - 1 Jul 2018
Externally published	Yes

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Rivas-Aguilar, M. E., Hernandez-Como, N., Gutierrez-Heredia, G., Sánchez-Martínez, A., Ramirez, M. M., Mejia, I., & Quevedo-López, M. A. (2018). Specific contact resistance of IGZO thin film transistors with metallic and transparent conductive oxides electrodes and XPS study of the contact/semiconductor interfaces. Current Applied Physics, 834-842. https://doi.org/10.1016/j.cap.2018.04.002

Rivas-Aguilar, M. E. ; Hernandez-Como, N. ; Gutierrez-Heredia, G. ; Sánchez-Martínez, A. ; Ramirez, M. Mireles ; Mejia, I. ; Quevedo-López, M. A. / Specific contact resistance of IGZO thin film transistors with metallic and transparent conductive oxides electrodes and XPS study of the contact/semiconductor interfaces. In: Current Applied Physics. 2018 ; pp. 834-842.

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title = "Specific contact resistance of IGZO thin film transistors with metallic and transparent conductive oxides electrodes and XPS study of the contact/semiconductor interfaces",

author = "Rivas-Aguilar, {M. E.} and N. Hernandez-Como and G. Gutierrez-Heredia and A. S{\'a}nchez-Mart{\'i}nez and Ramirez, {M. Mireles} and I. Mejia and Quevedo-L{\'o}pez, {M. A.}",

year = "2018",

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doi = "10.1016/j.cap.2018.04.002",

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Rivas-Aguilar, ME, Hernandez-Como, N, Gutierrez-Heredia, G, Sánchez-Martínez, A, Ramirez, MM, Mejia, I & Quevedo-López, MA 2018, 'Specific contact resistance of IGZO thin film transistors with metallic and transparent conductive oxides electrodes and XPS study of the contact/semiconductor interfaces', Current Applied Physics, pp. 834-842. https://doi.org/10.1016/j.cap.2018.04.002

Specific contact resistance of IGZO thin film transistors with metallic and transparent conductive oxides electrodes and XPS study of the contact/semiconductor interfaces. / Rivas-Aguilar, M. E.; Hernandez-Como, N.; Gutierrez-Heredia, G.; Sánchez-Martínez, A.; Ramirez, M. Mireles; Mejia, I.; Quevedo-López, M. A.

In: Current Applied Physics, 01.07.2018, p. 834-842.

Research output: Contribution to journal › Article › peer-review

TY - JOUR

T1 - Specific contact resistance of IGZO thin film transistors with metallic and transparent conductive oxides electrodes and XPS study of the contact/semiconductor interfaces

AU - Rivas-Aguilar, M. E.

AU - Hernandez-Como, N.

AU - Gutierrez-Heredia, G.

AU - Sánchez-Martínez, A.

AU - Ramirez, M. Mireles

AU - Mejia, I.

AU - Quevedo-López, M. A.

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JF - Current Applied Physics

SN - 1567-1739

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