Specific contact resistance of IGZO thin film transistors with metallic and transparent conductive oxides electrodes and XPS study of the contact/semiconductor interfaces

M. E. Rivas-Aguilar, N. Hernandez-Como, G. Gutierrez-Heredia, A. Sánchez-Martínez, M. Mireles Ramirez, I. Mejia, M. A. Quevedo-López

Research output: Contribution to journalArticle

3 Scopus citations
Original languageAmerican English
Pages (from-to)834-842
Number of pages9
JournalCurrent Applied Physics
DOIs
StatePublished - 1 Jul 2018
Externally publishedYes

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