Structural characterization and dielectric properties of hexagonal Lu(Fe, Ti)O3

Yoji Matsuo*, Takuya Hoshiyama, Shigeo Mori, Kenji Yoshii, Yuichi Michiue, Takashi Kambe, Naoshi Ikeda, Francisco Brown, Noboru Kimizuka

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

3 Scopus citations

Abstract

We investigated the average crystal structure and microstructures of LuFe0.56Ti0.44O3 by transmission electron microscopy (TEM) in combination with dielectric measurements. In this work, high-quality polycrystalline samples of LuFeM0.56Ti 0.44O3 were successfully synthesized in air by the conventional solid-state reaction. The average crystal structure at room temperature is characterized by a hexagonal structure (space group: P6 3cm). Dielectric measurements revealed that LuFe 0.56Ti0.44O3 shows broad dielectric peaks at approximately 450 and 580K, one of which is considered to originate from the formation of polar domains at the nanometer scale.

Original languageEnglish
Pages (from-to)09KB041-09KB043
JournalJapanese Journal of Applied Physics
Volume48
Issue number9 Part 2
DOIs
StatePublished - 2009

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