Structure and refractive index of thin alumina films grown by atomic layer deposition

M. Tulio Aguilar-Gama, Erik Ramírez-Morales, Z. Montiel-González*, A. Mendoza-Galván, Mérida Sotelo-Lerma, P. K. Nair, Hailin Hu

*Corresponding author for this work

Research output: Contribution to journal › Article › peer-review

31 Scopus citations

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