TY - JOUR
T1 - Synthesis and characterization of Sn2S3 as nanoparticles, powders and thin films, using soft chemistry reactions
AU - Godoy-Rosas, R.
AU - Barraza-Félix, S.
AU - Ramírez-Bon, R.
AU - Ochoa-Landin, R.
AU - Pineda-León, H. A.
AU - Flores-Acosta, M.
AU - Ruvalcaba-Manzo, S. G.
AU - Acosta-Enriquez, M. C.
AU - Castillo, S. J.
N1 - Publisher Copyright:
© 2017 National Institute R and D of Materials Physics. All rights reserved.
PY - 2017/9
Y1 - 2017/9
N2 - In this paper is proposed a new formulation to obtain Sn2S3 nanoparticles, powders, and thin films from aqueous solutions; where the main precursor compounds are a tin salt and a sulfur source. In the intermediate process was used a combination of two complexing agents in order to control the reaction and obtain nanoscale particles, these agents were polyethyleneimine, acetylacetone and a mix of ammonium hydroxide with ammonium chloride. The identification and measurement of the nanoparticles was by DLS, HRTEM, UV-vis, XPS, XRD and Raman Spectroscopy, where direct and indirect bandgaps were 1.65 and 1.31 eV, respectively, the corresponding crystallographic phase was orthorhombic, matching with the Powder Diffraction File, PDF # 14-0619. The calculated sizes were 6 nm by XRD and 13 nm by DLS.
AB - In this paper is proposed a new formulation to obtain Sn2S3 nanoparticles, powders, and thin films from aqueous solutions; where the main precursor compounds are a tin salt and a sulfur source. In the intermediate process was used a combination of two complexing agents in order to control the reaction and obtain nanoscale particles, these agents were polyethyleneimine, acetylacetone and a mix of ammonium hydroxide with ammonium chloride. The identification and measurement of the nanoparticles was by DLS, HRTEM, UV-vis, XPS, XRD and Raman Spectroscopy, where direct and indirect bandgaps were 1.65 and 1.31 eV, respectively, the corresponding crystallographic phase was orthorhombic, matching with the Powder Diffraction File, PDF # 14-0619. The calculated sizes were 6 nm by XRD and 13 nm by DLS.
KW - Materials characterization
KW - Nanoparticles
KW - Semiconductors
KW - Tin sulfide
UR - http://www.scopus.com/inward/record.url?scp=85030243966&partnerID=8YFLogxK
M3 - Artículo
SN - 1584-8663
VL - 14
SP - 365
EP - 371
JO - Chalcogenide Letters
JF - Chalcogenide Letters
IS - 9
ER -