This work it has the goal to present a way to grow synthetic plumbonacrite thin films. Our characterization started with XRD, from where we get a hexagonal structure of the Plumbonacrite corresponding compound. The following characterization considered was the absorption spectra in the visible region and from the energy band gap was calculated Eg=1.8 eV. Our reaction conditions lead to a thickness around of 375nm of the films, measured by ellipsometry and the resistivity of these thin films was measured giving around 110 MΩ. Also we did X-ray Photoelectrons Spectroscopy which probed that the thin films are mainly composed by lead and oxygen. Finally we are reporting the surface morphology through AFM were it can be observed the roughness at large scale.

Original languageEnglish
Pages (from-to)11-17
Number of pages7
JournalChalcogenide Letters
Issue number2
StatePublished - 2013


  • Plumbonacrite
  • Thin film
  • XRD


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